用X線衍射線形分析測定晶粒尺寸及微畸變的傅立葉級數合成方法

A Fourier Synthesis Method of X-Ray Diffraction Profile Analysis for Determination of Grain Size and Microdistortion

摘要: 本文提出了一個采用傅立葉級數合成方法分析X射線衍射線形來確定金屬多晶體中晶塊尺寸及微畸變的方法。與現存的其它方法相比較,這一方法所做的假設是最少的。

Abstract: This article put forward a Fourier synthesis method of X-ray diffraction profile analysis for determination of grain size and microdistor-tion. Comparing with the, other existing methods, the hypotheses applied in this method is minimum.